Thin Films Metrology - Advanced Measurement Applications with Alan Streater, Ph.D.

Description

Join us for an in-depth Thin Films Metrology class taught by Dr. Alan D. Streater, president of Boulder Optical Design Inc. With a Ph.D. in physics and over 30 years of experience in academia and the optics industry, Dr. Streater will guide you through essential techniques for evaluating thin film optics. Building on the essentials, this advanced course delves into specialized thin film measurement techniques, covering complex topics such as Phase, Polarization, Scattering, GD/GDD, and Ringdown. This course is designed for professionals seeking a deeper understanding of thin film measurement and its applications in diverse industries, with interactive demonstrations to enhance learning. Class Overview: This two-day survey course covers the foundational and advanced methods used to assess thin film quality, including spectral measurements, surface roughness, interferometry, ellipsometry, and more. The course is designed for professionals in the optics field, such as engineers, technicians, and end users of optical devices. Expect practical demos and insights that will enhance your understanding and application of these measurement techniques. Day 1: Focus on basics, including reflection and transmission measurements and surface quality analysis. Day 2: Advanced topics like index extraction, ellipsometry, and low-loss measurement techniques. Secure your spot today and elevate your expertise in thin film metrology!